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Pierre Bayon | Laboratoire Hubert Curien, Université de Saint-Etienne, France |
Florent Bernard | Laboratoire Hubert Curien, Université de Saint-Etienne, France |
Simona Buchovecka | Czech Technical University, Praque, Czech republic |
Karim Cherkaoui | Laboratoire Hubert Curien, Université de Saint-Etienne, France |
Pascal Cotret | Laboratoire Lab-STICC, Université de Bretagne Sud, France |
Jean-Luc Danger | TELECOM ParisTech, Paris, France |
Jean Da Rolt | Laboratoire LIRMM, Montpellier, France |
Nicolas Debande | TELECOM ParisTech, Paris, France |
Florian Devic | Netheos S.A.R.L., France |
Markus Dichtl | Siemens AG, Germany |
Viktor Fischer | Laboratoire Hubert Curien, Université de Saint-Etienne, France |
Julien Francq | EADS Defence & Security, Cyber Security Customer Solutions Center, France |
Kris Gaj | George Mason University, Fairfax, USA |
Sylvain Guilley | TELECOM ParisTech, Paris, France |
Tim Güneysu | Ruhr University Bochum, Germany |
Josef Hlavac | Czech Technical University, Praque, Czech republic |
Bernhard Jungk | Hochschule RheinMain, Wiesbaden, Germany |
Jens-Peter Kaps | George Mason University, Fairfax, USA |
Robert Lorencz | Czech Technical University, Praque, Czech republic |
Richard Newell | System-on-Chip Products Group, Microsemi Corp., USA |
Martin Novotny | Czech Technical University, Praque, Czech republic |
David Oswald | Ruhr University Bochum, Germany |
Christof Paar | Ruhr University Bochum, Germany |
Jonathan Pages | DRT Internet, France |
Vladimir Rozic | COSIC, K.U.Leuven, Belgium |
Werner Schindler | BSI Bonn, Germany |
Michal Varchola | Technical University of Kosice, Slovakia |
Ralf Zimmermann | Ruhr University Bochum, Germany |